23rd Annual Components for Military & Space Electronics Conference & Exhibition
April 16-18th, 2019
Four Points by Sheraton (LAX)
Los Angeles, California
Advance Program
click presentation titles to review abstract, final program subject to change
Tuesday, April 16th – Tutorials
1200 – 1300
Sit Down Lunch
0800 – 1200
Moisture in Microelectronics… Volatiles Control in Hermetic Electronic Components
Thomas Green, TJ Green Associates LLC
Robert Lowry, Electronic Materials Consultant
The tutorial includes a basic review of the Mil Spec test methods in place to prevent moisture related failures in military and other systems where functional reliability is of utmost importance (e.g. IC’s, Hybrids, MEMs, Class III Medical Implants, Optoelectronics, etc). It’s intended to enlighten the student on the negative, and sometimes catastrophic, consequences of too much moisture inside a hermetic enclosure. The class begins with a definition of hermeticity and a description of the latest hermeticity test methods in MIL-STD-883 TM 1014 and associated mil/space spec limits, along with IGA (Internal Gas Analysis) and the latest developments in TM 1018. Moisture failure case studies with significant consequences in terms of cost, schedule, loss of mission and system downtime will be reviewed.
1300 – 1700
Advanced Integrated Circuit Packaging and Reliability Issues
Richard Rao, Ph.D., Microchip Technology, Inc.
This short course provides a holistic understanding of all aspects of reliability failure mechanisms of an advanced IC packages. It covers advanced packaging technologies such as Flip Chip BGA, Wafer Level packages, 2.5D/3D Packages and Cu pillar and wirebonding; and their reliability failure modes and design solution.
0800 – 1700
Passive Component Reliability Workshop
Dr. Yuri Freeman, KEMET
John Marshall, AVX Corporation
Chris Reynolds, AVX Corporation
Scott Harris, Vanguard Electronics
Bryan Yarborough, Vishay Dale Electronics
The Passive Component Reliability Workshop course will be presented in three sessions covering capacitors, inductors and resistors.
Tantalum & Electrolytic Capacitors (Dr. Yuri Freeman, KEMET), MLCC & EMI filters (John Marshall, AVX Corporation) and SuperCapacitors, Film & Thin film capacitors (Chris Reynolds, AVX Corporation). Students will gain an understanding of capacitor construction and how performance characteristics are affected by time, temperature, voltage and frequency. The Inductor performance, reliability and selection session will be taught by (Scott Harris, Vanguard Electronics). This session will outline the basics of magnetics from an RF and power inductor and transformers point of view. Resistor theory, performance & reliability will be taught by (Bryan Yarborough, Vishay). Resistor types and materials will be discussed relative to component performance. Read more.
Wednesday, April 17th – Conference and Exhibits
1100 – 1930
Exhibitor Hours
0800 – 0810
Welcome/Intro
0810 – 0840
Keynote Address
MLCC Shortages: FY 2019 Tier-To-Tier replacement Strategies and Alternative Reference Design Solutions
Dennis Zogbi, Paumanok Publications, Inc.
This global market presentation offers a fresh look at the current market shortage in multilayered ceramic chip capacitors (MLCC) and offers the audience solutions based upon a tier-to-tier analysis of all known MLCC vendors by Case Size; followed by additional suggestions for solutions to the MLCC shortage based upon alternative capacitor case sizes for alternative reference designs…read more
Called a “National Treasure” by the former undersecretary of defense- Dennis Zogbi is the founder and lead researcher at Paumanok Publications and the author of more than 300 studies on the global market for passive electronic components and related raw materials. Mr Zogbi advises many of the largest hedge funds in the world in the area of mass produced and specialty electronic components and speaks on Wall Street on a monthly basis. He is dialed in to primary and secondary resources worldwide and has deep contacts and sticky customer relationships with companies, agencies and institutions in the USA, Japan, Germany, Korea, France, greater China, UK, central Africa and Canada. With his work with Leon Hamiter and CARTS MR Zogbi has presented market intelligence reports to the passive components industry in multiple locations worldwide. Mr Zogbi has also been Keynote speaker at EDS, ECIA Stats, CARMs and multiple other industry events. Mr Zogbi has written Marketeye for TTI/Berkshire Hathaway since 1999. Today Mr Zogbi will be discussing the shortage of MLCC and how it fits into the 30 year big data set that Paumanok has provided the global markets since 1988.
Session #1: Passive Components for Military and High Rel Space Systems – Presentations
0840 – 0905
Stable and Reliable Supply of Tantalum, Now and Going Forward
Roland Chavasse, Tantalum-Niobium International Study Center (T.I.C.)
0905 – 0930
Automotive vs. Hi-Rel and De-rating in Solid Tantalum Capacitors
Yuri Freeman, KEMET Electronics
0930 – 0955
Wet Tantalum Capacitor Development – Past, Present, Future
Mike Mosier, Vishay Intertechnology
0955 – 1010
COFFEE BREAK
1010 – 1035
Base Metal Ceramic Capacitor Developments on X7R Products for Space and High Reliability Applications
John Marshall, AVX Corporation
1035 – 1100
Effect of Environments on Parametric Degradation in Polymer Tantalum Capacitors
A. Teverovsky, NASA Goddard
1100 – 1125
MLCC and Tantalum Electrolytic Capacitor Interchangeability in High Capacitance Applications
Chris Reynolds, AVX Corporation
1125 – 1150
Integrated Power Management with Ferromagnetic Thin-Film Power Inductors
Noah Sturcken, Ferric
1150 – 1345
LUNCH in the Exhibits Area
1345 – 1445
Panel Discussion: Mil/Aerospace Talent Gap… How to Attract and Retain Young Engineers (1 Hr)
Panelists:
Rick Rodriguez, Component Engineering Mgr., Raytheon Missile Systems
Roz Morrison, HR Manager, Raytheon Missile Systems
Dr. Michael Hamilton, Auburn University, Director, Alabama Micro/Nano Science & Technology Center
Moderator:
Tom Green, TJ Green Associates LLC
The purpose of this open panel discussion is to bring into focus divergent views on the industry wide problem of an aging workforce in the Military and Aerospace. The “gray beards”, as they’re known, are leaving our industry and a large gap in both talent and experience has emerged that is slowing our ability to grow and meet the challenges of building reliable next generation weapon systems…read more
1445 – 1510
Termination cracking in MIL-PRF-55342 Chip Resistors
Mike Cozzolino, Raytheon Company
1510 – 1535
1535 – 1550
COFFEE BREAK
1550 – 1615
Embedded Thin Film Nickel-Phosphorus Resistors
Bruce Mahler, Ohmega Technologies, Inc.
1615 – 1640
A Case Study of Grain Slippage in Wirebound RTDs
Mike Cozzolino, Raytheon Company
Session #2: RF and Power GaN Technology – Presentations
1640 – 1700
Space Qualification of GaN HEMTs -Guidance Document Announcement
John Scarpulla, The Aerospace Corporation
1700 – 1720
Liquid Crystal Polymer High Speed-RF High Layer Count Circuits with Embedded Die Options
James Rathburn, HSIO Technologies, LLC
1720 – 1740
Power Enhancement Mode GaN HEMT update
Jim Larrauri, Freebird Semiconductor
1740 – 1800
Eutectic Die Attach for High Power GaN Devices
Casey Krawiec, StratEdge Corporation
1800 – 2000
Welcome Reception in Exhibits Area
Thursday, April 18th – Conference and Exhibits
1000 – 1400
Exhibitor Hours
0800 – 0830
Keynote Address
Flexibility and Innovation in Military Systems
Jonathan Ahlbin, MDA
In an era of near-peer competition, the development of military systems need to become faster. To achieve this goal, industry and government need to use innovative collaborative processes to ensure the systems meet performance, reliability, and availability requirements…read more
Dr. Jonathan Ahlbin is the Missile Defense Agency, Division Chief for Parts, Materials, and Processes Engineering (Acting) and the Branch Lead for EEE Parts Engineering. In these roles, he is responsible for implementing and managing the team that oversees all MDA BMDS parts, materials, and process requirements and policies that include Counterfeit Parts, Part Selection and procurement, Screening & Qualification Criteria, Failure Analysis, Radiation Hardness Assurance, and Materials Engineering. Dr. Ahlbin has a BE, MS, and PhD in Electrical Engineering all from Vanderbilt University. He has published over 50 papers in the areas of microelectronic reliability, radiation survivability, and supply chain risk management. Previously, Dr. Ahlbin worked for USC-ISI as a Senior Electrical Engineer supporting research and development programs for DARPA, IARPA, and DTRA.
Session #3: Advanced Packaging for Military and Aerospace – Presentations
0830 – 0855
Honeywell: The Path to Affordable Electronics for Commercial Space Constellations
Anthony Casasnovas, Honeywell
0855 – 0920
System in Package Technologies for Space Applications
Doug Sheldon, NASA Jet Propulsion Laboratory
0920 – 0945
Thin Is In – The Challenge and Solution of Picking Thinner Die
Sarah Parrish, Royce Instruments
0945 – 1010
MIL-PRF-19500 Appendix J: Inclusion of Plastic Encapsulated Discrete Semiconductor (PEDs) Devices for Military Applications
Benny Damron, NASA/Jacobs Space Exploration Group (JSEG)
Ronan Dillon, Microchip Technologies
1010 – 1025
COFFEE BREAK
1025 – 1050
ATROX – Die Attach Using Hybrid Silver Sintering Technology
Michael Previti, MacDermid Alpha
1050 – 1115
An Overview on Chip to Package Interaction Reliability Issues
Richard Rao, Microchip
1115 – 1140
CCA Conformal Coatings, Best Practice- Application & Optical Microscopy Inspection Methods
Aaron C. DerMarderosian Jr., Raytheon Company
1140 – 1205
Visual Identification of Organic Residue on Microelectronic Components via In-Process Visible Light Fluorescence
Tristan Baldwin, BAE Systems
1205 – 1335
LUNCH in the Exhibits Area
Session #4: Component Technology Reliability Issues and the Trusted Supply Chain – Presentations
1335 – 1400
Copper Bond Wire Reliability & Decap Challenges
Aaron Lecomte, Raytheon Company
1400 – 1425
Decapsulation for Failure Analysis without Damage to Cu and Ag Wires
Bruce Wilson, BSET EQ
1425 – 1450
RGA & Lid-Seal: Waivers, Woes & Wants
Andy Moor, Northrop Grumman Mission Systems
1450 – 1505
Lid Voiding Hermeticity
Rich Richardson, MicroCircuit Laboratories
1505 – 1530
SCHURTER Fuses for Space
Bruno Zemp, Schurter Electronic Components
1530 – 1555
COFFEE BREAK
1555 – 1620
Predictive Maintenance
Ed Dodd, DfR Solutions
1620 – 1645
Flexible Superconducting Interconnect Technology for Future Cryogenic Electronics Systems
Dr. Michael C. Hamilton, Auburn University
1645 – 1710
Biodegradable Electronics Packaging
Robert Lowry, Electronic Materials Consulting
1710
Conference Ends